Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd ed - Manoj Sachdev, Jose Pineda de Gyvez 文件大小:6MB 分类:文档书籍 创建时间:2018-03-01 热度:106
Kriegel - SQL Bible (Wiley, 2003).chm &JPEG2000 Standard for Image Compression Concepts, Algorithms and VLSI 文件大小:21MB 分类:文档书籍 创建时间:2018-03-29 热度:132
Digital Integrated Circuit Design From VLSI Architectures to CMOS 文件大小:12MB 分类:文档书籍 创建时间:2018-03-04 热度:154
John Wiley & Sons - Managing Power Electronics VLSI And DSP Driven Computer Systems Nov 2005 - {RedDragon 文件大小:19MB 分类:文档书籍 创建时间:2018-02-27 热度:163
